Fluorescence Analysis

Lambda provides energy dispersive x-ray fluorescence analysis using a Silicon Drift Diode (SDD) detector system. Qualitative and semi-quantitative analyses are performed using the Fundamental Parameters Method. The system is designed for bulk sample analysis irradiating a nominally 5 mm circular zone. Detection of elemental constituents from aluminum to uranium is possible. Samples may be in the form of solids, alloys, powders, or liquids and are usually either analyzed “as is” or using Mylar film mountings

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