Orientation ratios allow the integrated peak intensities from a diffraction pattern to be compared to the peak intensities of what a randomly oriented specimen would produce. These data provide information as to the degree of preferred orientation present for particular crystallographic planes lying parallel to the specimen surface. Unlike a pole figure, orientation ratios will not distinguish directionality within the surface, but may still provide useful information at a lower cost than a complete texture analysis.
Much of the instrumentation and virtually all of the data collection software have been developed in our laboratory to meet the specific specimens and testing requirements of our clients. Orientation Distribution Function (ODF) analysis is provided by either the harmonic or WIMV (Williams-Imhof-Matthies-Vinel) methods. Techniques range from simple film methods to determine wire-drawing textures to multiple equal area net Schulz back-reflection pole figures. Data presentation ranges from peak ratio monitoring for quality control to full ODF analysis and recalculation of direct pole figures, inverse pole figures, and texture fibers.