Crystallographic Texture & ODF Analysis

Preferred Orientation

Extensive experience determining the crystallographic "texture," or preferred orientation in a wide variety of materials and forms.

Lambda Technologies has extensive experience determining the crystallographic "texture," or preferred orientation, in a wide variety of materials and forms. Much of the instrumentation and virtually all of the data collection software have been developed in our laboratory to meet the specific specimens and testing requirements of our clients. Orientation Distribution Function (ODF) analysis is provided by either the harmonic or WIMV (Williams-Imhof-Matthies-Vinel) methods. Techniques range from simple film methods to determine wire-drawing textures to multiple equal area net Schulz back-reflection pole figures. Data presentation ranges from peak ratio monitoring for quality control to full orientation distribution function (ODF) analysis and recalculation of direct pole figures, inverse pole figures, and texture fibers. Through complete control of the data collection and reduction software, Lambda offers texture studies and data presentations providing the highest accuracy and testing efficiency possible.

Features

• Schulz back-reflection pole figures using equal area data collection nets for optimum efficiency at spacings tailored to the application.
• Multiple pole figures obtained for selected (hkl) without sample remounting.
• Instrument positioning to the centroid of the diffracted intensity is performed automatically prior to data collection.
• Data presentation in either a true times, random or normalized format.
• Corrections for specimen transparency, allowing accurate texture measurement in thin films.
• Defocusing corrections can be performed either analytically or empirically.
• ODF analysis using popLA software and data file distribution to clients in popLA format.
• Inverse pole figure calculation from powder diffraction patterns.
• Film techniques for direct calculation of fiber textures.
• Calculation of inverse and direct pole figures from ODF analysis.
• Partial pole figures for thin films.

Application Examples

• Monitoring texture in zirconium and hafnium alloy nuclear fuel tubing.
• Texture development studies and quality control monitoring of texture in sputtering targets for a wide range of materials.
• Quantifying textures developed by a wide variety of extrusion, drawing, casting, rolling, and coating processes.

Supporting Services

• Complete Electrical Discharge Machine (EDM) and machine shop sectioning support for sample preparation.
• Facilities and techniques for tube thinning and elastic mounting for texture measurement in tubular specimens.
• Facilities and techniques for tube thinning and elastic mounting for texture measurement in tubular specimens.

Related Articles

• Lambda Research Diffraction Notes, No. 6, "Pole Figure Determination".
• Lambda Research Diffraction Notes, No. 14, “Analysis of Radially Symmetric Textures Using Partial Pole Figures”.